Scanning Transmission Electron Microscopy of Nanomaterials: Basics of Imaging and Analysis By: Nobuo Tanaka | PDF | 34.74 MiB
June 6th 2014 | ISBN: 184816789X | English | 616 pages
Author: Nobuo Tanaka
The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.
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