This book introduces the basic concepts necessary to understand Single Event phenomena which could cause random performance errors and catastrophic failures to electronics devices. As miniaturization of electronics components advances, electronics components are more susceptible in the radiation environment. The book includes a discussion of the radiation environments in space and in the atmosphere, radiation rate prediction depending on the orbit to allow electronics engineers to design and select radiation tolerant components and systems, and single event prediction.Content: Chapter 1 Introduction (pages 1-12): Chapter 2 Foundations of Single Event Analysis and Prediction (pages 13-76): Chapter 3 Optimizing Heavy Ion Experiments for Analysis (pages 77-102): Chapter 4 Optimizing Proton Testing (pages 103-109): Chapter 5 Data Qualification and Interpretation (pages 111-164): Chapter 6 Analysis of Various Types of SEU Data (pages 165-250): Chapter 7 Cosmic Ray Single Event Rate Calculations (pages 251-303): Chapter 8 Proton Single Event Rate Calculations (pages 305-328): Chapter 9 Neutron Induced Upset (pages 329-336): Chapter 10 Upsets Produced by Heavy Ion Nuclear Reactions (pages 337-343): Chapter 11 Samples of Heavy Ion Rate Prediction (pages 345-370): Chapter 12 Samples of Proton Rate Predictions (pages 371-374): Chapter 13 Combined Environments (pages 375-387): Chapter 14 Samples of Solar Events and Extreme Situations (pages 389-393): Chapter 15 Upset Rates in Neutral Particle Beam (NPB) Environments (pages 395-400): Chapter 16 Predictions and Observations of SEU Rates in Space (pages 401-427): Chapter 17 Limitations of the IRPP Approach (pages 429-434):