Kouichi Tsuji, Jasna Injuk, René Van Grieken, "X-Ray Spectrometry: Recent Technological Advances"
English | 2004 | ISBN: 047148640X | PDF | pages: 616 | 15.5 mb
X-Ray Spectrometry: Recent Technological Advances covers thelatest developments and areas of research in the methodological andinstrumental aspects of x-ray spectrometry.
- Includes the most advanced and high-tech aspects of thechemical analysis techniques based on x-rays
- Introduces new types of X-ray optics and X-ray detectors,covering history, principles, characteristics and futuretrends
- Written by internationally recognized scientists, all of whomare eminent specialists in each of the sub-fields
- Sections include: X-Ray Sources, X-Ray Optics, X-Ray Detectors,Special Configurations, New Computerization Methods, NewApplications
This valuable book will assist all analytical chemists and otherusers of x-ray spectrometry to fully exploit the capabilities ofthis set of powerful analytical tools and to further expandapplications in such fields as material and environmental sciences,medicine, toxicology, forensics, archaeometry and many others.
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